文献检索/Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and ReliabilityEM-T2Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability2020-05-26第 234 卷第 4 期，579-587A censored sequential posterior odd test method in testability demonstration test planningYong ZhangNational University of Defense TechnologyChao WangNational University of Defense TechnologyXin LinNational University of Defense TechnologyGuanjun LiuNational University of Defense TechnologyPeng Ling YangNational University of Defense TechnologyJing QiuNational University of Defense Technology去出版社页面 引用论文图谱收藏 被引提醒分享打印登录后看摘要和中文要点英文摘要、AI 生成的中文摘要和三条要点、参考文献和引证文献列表、论文图谱，注册免费。登录 / 注册关键词sequential samplingaverage sample numberfault detection and isolationsmall sample testingtest cost reductionproducer and consumer risk参考文献10引证文献0相似文献引文网络关联作者相关机构登录后可以看完整列表。去登录论文图谱本篇和它的参考文献、引证文献、相似文献登录后可以看这篇的论文图谱：谁被它引用、谁引用了它、还有哪些相似的研究。登录 / 注册
