文献检索/Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and ReliabilityEM-T2Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability2020-05-02第 234 卷第 6 期，779-792Novel algorithms for sequential fault diagnosis based on greedy methodHeng TianHenan University of Science and TechnologyFuhai DuanDalian University of TechnologyYong SangDalian University of TechnologyLiang FanAviChina Industry & Technology (China)去出版社页面 引用论文图谱收藏 被引提醒分享打印登录后看摘要和中文要点英文摘要、AI 生成的中文摘要和三条要点、参考文献和引证文献列表、论文图谱，注册免费。登录 / 注册关键词test sequencinggreedy algorithmShannon entropyD-matrixbinary systemsstochastic simulation参考文献19引证文献0相似文献引文网络关联作者相关机构登录后可以看完整列表。去登录论文图谱本篇和它的参考文献、引证文献、相似文献登录后可以看这篇的论文图谱：谁被它引用、谁引用了它、还有哪些相似的研究。登录 / 注册
