文献检索/Expert Systems with ApplicationsEM-WoSExpert Systems with Applications2024-07-27第 256 卷,124890-124890Few-shot anomaly detection using positive unlabeled learning with cycle consistency and co-occurrence featuresSion AnDaegu Gyeongbuk Institute of Science and TechnologyJaehong KimDaegu Gyeongbuk Institute of Science and TechnologySoopil KimDaegu Gyeongbuk Institute of Science and TechnologyPhilip ChikontweHarvard UniversityJiwook JungLG (South Korea)Hyejeong JeonLG (South Korea)Sang Hyun ParkDaegu Gyeongbuk Institute of Science and Technology去出版社页面 引用论文图谱收藏 被引提醒分享打印登录后看摘要和中文要点英文摘要、AI 生成的中文摘要和三条要点、参考文献和引证文献列表、论文图谱,注册免费。登录 / 注册关键词few-shot anomaly detectionpositive-unlabeled learningcycle consistencyco-occurrence featuresdefect detectionindustrial visual inspectionmemory bankdensity estimationlimited labeled data参考文献74引证文献2相似文献引文网络关联作者相关机构登录后可以看完整列表。去登录论文图谱本篇和它的参考文献、引证文献、相似文献登录后可以看这篇的论文图谱:谁被它引用、谁引用了它、还有哪些相似的研究。登录 / 注册