文献检索/Computers & Industrial EngineeringEM-WoSComputers & Industrial Engineering2024-02-01第 189 卷，109936-109936开放获取Domain-knowledge-informed functional outlier detection for line quality control systemsJong Hwan MunUlsan National Institute of Science and TechnologyJitae YooUlsan National Institute of Science and TechnologyHee-Sun KimLG (South Korea)Heesun KimLG (South Korea)Nayi RyuLG (South Korea)Sungil KimUlsan National Institute of Science and Technology去出版社页面 引用论文图谱收藏 被引提醒分享打印登录后看摘要和中文要点英文摘要、AI 生成的中文摘要和三条要点、参考文献和引证文献列表、论文图谱，注册免费。登录 / 注册关键词hidden defectsdomain knowledgesequential transformationszero-defect manufacturingsensor datadefective product detection参考文献30引证文献4相似文献引文网络关联作者相关机构登录后可以看完整列表。去登录论文图谱本篇和它的参考文献、引证文献、相似文献登录后可以看这篇的论文图谱：谁被它引用、谁引用了它、还有哪些相似的研究。登录 / 注册
