SK Group (United States)

本机构学者在这里署名、按本站篇数

合作机构同一篇文章里的其他机构

1. Sungkyunkwan University韩国1
2. Pohang University of Science and Technology韩国1
3. Korea Advanced Institute of Science and Technology韩国1
4. Tech University of Korea韩国1
5. Yonsei University韩国1
6. Chung-Ang University韩国1

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最新文献

1. 1
   High-Resolution neural attenuation field for industrial computed tomographyExpert Systems with Applications20250
2. 2
   Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuitsExpert Systems with Applications20222
3. 3
   An oversampling method for wafer map defect pattern classification considering small and imbalanced dataComputers & Industrial Engineering202130

高被引文献

1. 1
   An oversampling method for wafer map defect pattern classification considering small and imbalanced dataComputers & Industrial Engineering202130
2. 2
   Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuitsExpert Systems with Applications20222

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