文献检索/Expert Systems with ApplicationsEM-WoSExpert Systems with Applications2023-05-29第 230 卷，120544-120544开放获取高影响力 · 前 10%Wafer map defect pattern detection method based on improved attention mechanismShouhong ChenGuangxi Key Laboratory of Automatic Detecting Technology and InstrumentsMeiqi LiuGuangxi Key Laboratory of Automatic Detecting Technology and InstrumentsXingna HouGuangxi Key Laboratory of Automatic Detecting Technology and InstrumentsZiren ZhuGuangxi Key Laboratory of Automatic Detecting Technology and InstrumentsZhentao HuangGuangxi Key Laboratory of Automatic Detecting Technology and InstrumentsTao WangGuangxi Key Laboratory of Automatic Detecting Technology and Instruments去出版社页面 引用论文图谱收藏 被引提醒分享打印登录后看摘要和中文要点英文摘要、AI 生成的中文摘要和三条要点、参考文献和引证文献列表、论文图谱，注册免费。登录 / 注册关键词defect pattern recognitiondefect classificationattention mechanismResNeXt-50support vector machineerror-correcting output codessemiconductor manufacturingfeature extraction参考文献35引证文献10相似文献引文网络关联作者相关机构登录后可以看完整列表。去登录论文图谱本篇和它的参考文献、引证文献、相似文献登录后可以看这篇的论文图谱：谁被它引用、谁引用了它、还有哪些相似的研究。登录 / 注册
