Zhentao Huang

Guangxi Key Laboratory of Automatic Detecting Technology and Instruments

2本站收录论文

89这些论文的被引

2本站 h 指数

5合作者

作者编号 A5058034390 · ORCID 0000-0003-4141-320X。统计只算本站收录的论文。

发表的论文2 篇，按出版时间

1
Wafer map defect pattern detection method based on improved attention mechanismExpert Systems with Applications202356
2
Mixed-Type Wafer Defect Detection Based on Multi-Branch Feature Enhanced Residual ModuleExpert Systems with Applications202333

按月发文

逐年被引

合作者

Tao Wang2 篇 Shouhong Chen2 篇 Xingna Hou2 篇 Jun Ma1 篇 Ziren Zhu1 篇

研究主题和期刊

Expert Systems with Applications2