EM-T1International Journal of Disaster Risk Reduction2026142: 106214-106214A defect-informed smart prioritisation framework for landslide risk assessment of masonry arch bridgesLorenzo Brezzi, Alessandro Scala, Luca Simoni被引 0阅读 4开放获取环境管理、监测、政策与法规复合灾害与灾害链
EM-WoSExpert Systems with Applications2023230: 120544-120544Wafer map defect pattern detection method based on improved attention mechanismShouhong Chen, Meiqi Liu, Xingna Hou, Ziren Zhu 等 6 人被引 56阅读 2高影响力 前 10%开放获取工业与制造工程
EM-WoSComputers & Industrial Engineering2021162: 107767-107767An oversampling method for wafer map defect pattern classification considering small and imbalanced dataEun‐Su Kim, Seung-Hyun Choi, Dong‐Hee Lee, Kwang-Jae Kim 等 6 人被引 30阅读 2基金工业与制造工程
EM-T2Journal of Transportation Safety & Security202618(8): 991-1024Safety assessment and influencing factors analysis of unsignalized intersections on national highways based on traffic conflictsXu Sheng Zhao, Linjie Gao, Licheng Yang, Anning Ni 等 6 人被引 0阅读 1安全、风险、可靠性与质量金融风险与机器学习
EM-WoSComputers & Industrial Engineering2022172: 108614-108614An ensemble-based deep semi-supervised learning for the classification of Wafer Bin Maps defect patternsSiyamalan Manivannan被引 28阅读 1工业与制造工程
EM-WoSComputers & Industrial Engineering2022167: 107996-107996Mixup-based classification of mixed-type defect patterns in wafer bin mapsWooksoo Shin, Hyungu Kahng, Seoung Bum Kim被引 32阅读 2高影响力 前 10%基金工业与制造工程
EM-WoSExpert Systems with Applications2024260: 125378-125378A framework for detecting unknown defect patterns on wafer bin maps using active learningJin-Su Shin, Min-Joo Kim, Dong‐Hee Lee被引 28阅读 3高影响力 前 10%基金工业与制造工程
EM-WoSExpert Systems with Applications2023231: 120765-120765A novel approach for wafer defect pattern classification based on topological data analysisSeungchan Ko, Dowan Koo被引 19高影响力 前 10%基金开放获取计算理论与数学
EM-WoSExpert Systems with Applications2022202: 117341-117341Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuitsHyun Soo Shin, Youngju Kim, Chang Ouk Kim, Sung Ho Park被引 2阅读 1工业与制造工程
EM-WoSComputers & Industrial Engineering2022166: 107977-107977Semi-automatic wafer map pattern classification with convolutional neural networksSuhee Yoon, Seokho Kang被引 41阅读 1高影响力 前 10%基金工业与制造工程
EM-WoSExpert Systems with Applications2021183: 115429-115429Active cluster annotation for wafer map pattern classification in semiconductor manufacturingJaewoong Shim, Seokho Kang, Sungzoon Cho被引 22阅读 1基金工业与制造工程
EM-WoSInformation Sciences2018459: 53-70Novel algorithms for cost-sensitive classification and knowledge discovery in class imbalanced datasets with an application to NASA software defectsMichael J. Siers, Md Zahidul Islam被引 37高影响力 前 10%人工智能
EM-T2International Journal of Occupational Safety and Ergonomics20261-11Estimation of prevalence of pneumoconiosis among Indian dental healthcare professionals – an analytical cross-sectional studyHarpreet Singh, Avni Bansal, Raj K. Maurya, Pranav Kapoor 等 7 人被引 0阅读 3基金呼吸医学
EM-WoSExpert Systems with Applications2022215: 119363-119363Decision fusion approach for detecting unknown wafer bin map patterns based on a deep multitask learning modelJaeyeon Jang, Gyeong Taek Lee被引 14阅读 1基金开放获取工业与制造工程
EM-WoSExpert Systems with Applications2020149: 113252-113252Anomaly pattern detection for streaming dataTaegong Kim, Cheong Hee Park被引 37阅读 2高影响力 前 10%基金人工智能
